A Starry Byte — proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker

Abstract Single Event Effects (SEEs) — predominately bit-flips in electronics caused by particle interactions - are a major concern for ASICs operated high radiation environments such as ABCStar ASICs, which designed to be used the future ATLAS ITk strip tracker. The chip design is therefore optimised protect it from SEEs implementing triplication techniques Triple Modular Redundancy (TMR). In order verify protection mechanisms of design, cross-section Upsets (SEUs), particular class SEEs, measured exposing high-intensity beams while monitoring observed SEUs. This study presents setup, performed measurements, and results SEU tests using latest version ASIC (ABCStar V1) 480 MeV proton beam.